Information for "Non-contact wafer testing"
Basic information
| Display title | Non-contact wafer testing |
| Default sort key | Non-contact wafer testing |
| Page length (in bytes) | 4,812 |
| Namespace ID | 0 |
| Page ID | 18026663 |
| Page content language | en - English |
| Page content model | wikitext |
| Indexing by robots | Allowed |
| Number of page watchers | Fewer than 30 watchers |
| Number of redirects to this page | 0 |
| Counted as a content page | Yes |
| Wikidata item ID | Q7048881 |
| Page views in the past 30 days |
Page protection
| Edit | Allow all users (no expiry set) |
| Move | Allow all users (no expiry set) |
Edit history
| Page creator | Wfraga (talk | contribs) |
| Date of page creation | 19:44, 19 June 2008 |
| Latest editor | JdelaF (talk | contribs) |
| Date of latest edit | 20:37, 17 November 2024 |
| Total number of edits | 22 |
| Recent number of edits (within past 30 days) | 0 |
| Recent number of distinct authors | 0 |