PIND: Difference between revisions
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'''PiND''' |
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In the early spring of 2000 in the small farming community of Smoky Lake Alberta three teenage rejects crossed paths at the local burger joint. In between puffs on a funny cigarette and swiggs on a spiked slurpee, the notion of a rock and roll band became the topic of conversation. That very evening in a run down house, in the presence of 3 or 4 close friends and a 24 pack of even closer friends, something amazing happened. The air was calm that night. That is untill the machine gun drums, thundering bass and screaming guitar sounds cut the otherwise silent evening. That night the legend now known as PIND was born. For four and a half years PIND partied and played and played and partied. They've blown the roofs off of bars and caved in the ceilings of basements. They've been kicked down in the dirt and have got back up. They've stared the devil in the eye and laughed in his face. Above all, they've survived to tell the story. In August 2005, PIND took a major leap in their career and added a second guitarist. A man that fears no beverage; fears no teenage girl; fears nothing. With a new player on board and a lot of experience under their belt PIND is embarking on a new step in their Punk Rock endeavor. So lock up you daughters and lock up you wife cuz the PIND boys are coming to town. |
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According to method 2020.9 of [[MIL-STD-883]] and method 2052.5 of [[MIL-STD-750]], the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient [[mass]] that, upon impact within the cavity, excite the [[transducer]]. |
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<ref>{{cite web|title=Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5|url=http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf|publisher=Department of Defense|accessdate=17 December 2015|archive-url=https://web.archive.org/web/20160304190531/http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf|archive-date=4 March 2016|url-status=dead}}</ref> |
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[[Category:rock and roll]] |
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<ref>{{cite web|title=TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F|url=http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf|publisher=Department of Defense|access-date=2015-12-17|archive-url=https://web.archive.org/web/20151222165824/http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf|archive-date=2015-12-22|url-status=dead}}</ref> |
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==References== |
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{{Reflist}} |
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[[Category:Nondestructive testing]] |
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The purpose of a PIND test is to detect loose particles inside a device cavity. The test provides a nondestructive |
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means of identifying those devices containing particles of sufficient [[mass]] that, upon impact with the case, excite the [[transducer]]. |
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{{measurement-stub}} |
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[[Category:rock and roll]] |
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Latest revision as of 11:18, 28 April 2020
A PIND test is a Particle Impact Noise Detection test.
According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.
References
[edit]- ^ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5" (PDF). Department of Defense. Archived from the original (PDF) on 4 March 2016. Retrieved 17 December 2015.
- ^ "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F" (PDF). Department of Defense. Archived from the original (PDF) on 2015-12-22. Retrieved 2015-12-17.
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