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A '''PIND''' test is a Particle Impact Noise Detection test.
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A '''PIND''' test is a Particle Impact Noise Detection Test.


The purpose of a PIND test is to detect loose particles inside a device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient [[mass]] that, upon impact within the cavity, excite the [[transducer]] a high frequency "microphone".
According to method 2020.9 of [[MIL-STD-883]] and method 2052.5 of [[MIL-STD-750]], the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient [[mass]] that, upon impact within the cavity, excite the [[transducer]].
[http://www.b-w-engineering.com]
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<ref>{{cite web|title=Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5|url=http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf|publisher=Department of Defense|accessdate=17 December 2015|archive-url=https://web.archive.org/web/20160304190531/http://www.dscc.dla.mil/downloads/milspec/docs/mil-std-883/std883.pdf|archive-date=4 March 2016|url-status=dead}}</ref>
|}]]].
<ref>{{cite web|title=TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F|url=http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf|publisher=Department of Defense|access-date=2015-12-17|archive-url=https://web.archive.org/web/20151222165824/http://www.landandmaritime.dla.mil/Downloads/MilSpec/Docs/MIL-STD-750/std750part2.pdf|archive-date=2015-12-22|url-status=dead}}</ref>


==References==
{{DEFAULTSORT:Pind}}
{{Reflist}}
[[Category:Particle physics]]


[[Category:Nondestructive testing]]



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Latest revision as of 11:18, 28 April 2020

A PIND test is a Particle Impact Noise Detection test.

According to method 2020.9 of MIL-STD-883 and method 2052.5 of MIL-STD-750, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.

[1] [2]

References

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  1. ^ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5" (PDF). Department of Defense. Archived from the original (PDF) on 4 March 2016. Retrieved 17 December 2015.
  2. ^ "TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES MIL-STD-750F" (PDF). Department of Defense. Archived from the original (PDF) on 2015-12-22. Retrieved 2015-12-17.