Ion beam analysis: Difference between revisions
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Revision as of 16:04, 3 August 2005
Ion Beam Analysis is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition, obtain elemental depth profiles, or determine the depth profile of damage in single crystals. The last conference (Albuqueque, New Mexico, 2003) was published in Nuclear Instruments and Methods
RBS: Rutherford backscattering is sensitive to heavy elements in a light matrix
ERD: Elastic recoil analysis is sensitive to light elements in a heavy matrix
PIXE: Particle induced X-ray emission gives the trace and minor elemental composition
NRA: Nuclear reaction analysis is sentitive to particular isotopes
Channelling:
External Links
- bi-annual scientific conference devoted to IBA: the latest was in Seville in June 2005: http://www.us.es/iba2005/