Ion beam analysis: Difference between revisions
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Ion Beam Analysis is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition, obtain elemental depth profiles, or determine the depth profile of damage in single crystals. The last conference (Albuqueque, New Mexico, 2003) was published in Nuclear Instruments and Methods |
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RBS: [[Rutherford backscattering]] is sensitive to heavy elements in a light matrix |
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ERD: [[Elastic recoil analysis]] is sensitive to light elements in a heavy matrix |
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PIXE: [[Particle induced X-ray emission]] gives the trace and minor elemental composition |
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NRA: [[Nuclear reaction analysis]] is sentitive to particular isotopes |
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Channelling: |
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==External Links== |
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* bi-annual scientific conference devoted to IBA: the latest was in Seville in June 2005: http://www.us.es/iba2005/ |
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