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==External links==
==External links==
* [http://www.jedec.org/standards-documents/results/js001-2011 New joint standard: ANSI/ESDA/JEDEC JS-001-2011, For Electrostatic Discharge Sensitivity Testing, Human Body Model (HBM) - Component Level]
* [http://www.jedec.org/standards-documents/results/js001-2011 New Joint Standard: ANSI/ESDA/JEDEC JS-001-2011, For Electrostatic Discharge Sensitivity Testing, Human Body Model (HBM) - Component Level]
* [http://www.jedec.org/news/pressreleases/esd-association-and-jedec-publish-new-revision-standard-electrostatic-discharge-s New Joint standard JS-001-2011 info.]
* [http://www.jedec.org/news/pressreleases/esd-association-and-jedec-publish-new-revision-standard-electrostatic-discharge-s New Joint Standard JS-001-2011 info.]
* [http://www.dscc.dla.mil/Programs/MilSpec/ListDocs.asp?BasicDoc=MIL-STD-883 MIL-STD-883G – Test Method Standard, Microcircuits]
* [http://www.dscc.dla.mil/Programs/MilSpec/ListDocs.asp?BasicDoc=MIL-STD-883 MIL-STD-883G – Test Method Standard, Microcircuits]
* [http://www.whitemountainlabs.com/humanbodymodel.aspx Human Body Model Overview]
* [http://www.whitemountainlabs.com/humanbodymodel.aspx Human Body Model Overview]

Revision as of 01:05, 29 October 2011

The human-body model (HBM) is the most commonly used model for characterizing the susceptibility of an electronic device to damage from electrostatic discharge (ESD). The model is a simulation of the discharge which might occur when a human touches an electronic device.

The HBM definition most widely used is the test model defined in the United States military standard, MIL-STD-883, Method 3015.8, Electrostatic Discharge Sensitivity Classification. This method establishes a simplified equivalent electrical circuit and the necessary test procedures required to model an HBM ESD event.

An internationally widely used standard is JEDEC standard JS-001.

Model

In both JS-001-2010 and MIL-STD-883G the charged human body is modeled by a 100 pF capacitor and a 1500 ohm discharging resistance. During testing, the fully charged capacitor is discharged through the resistor connected in series to the device under test.

See also