* Component Level Automatic Analog Fault Diagnostic(current RA research topic)<br>
*#- The research is meant to give an answer to the following question: Given a network( node, branch, connectivity ), how do we break it into subcircuits such that we have a good test coverage with reasonable complexity.<br>
Biography: Li-Hsien obtained his BS from Department of Electrical Engineering at National Chiao-Tung University, Hisn-Chu, Taiwan in 1998. He completed his R.O.C army service in 2000. He got his MS from Santa Clara University, CA, USA with emphasis on Integrated Electronics during 2002.Since then he has worked with Micron Technology and Yuantonix. He is currently working in University of Alabama, Tuscaloosa, AL, USA as a PhD student with Texas Instrument.His profession experience includes IC Testing/Product/Design Engineer
