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A '''recurrence tracking microscope''' (RTM) is a microscope which is based on the quantum recurrence phenomenon of an atomic wave packet, used to investigate the nano-structure on a surface.
A '''recurrence tracking microscope''' (RTM) is a microscope which is based on the quantum recurrence phenomenon of an atomic wave packet, used to investigate the nano-structure on a surface.


The tunneling phenomenon <ref>Razavy, Mohsen, Quantum Theory of tunneling (World Scientific, 2003).</ref> in quantum mechanics, an evanescent wave coupling effect, is used as a probe to study nano-structure on a surface with the help of [[scanning tunneling microscope]] (STM).<ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50, 120(1983).</ref><ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).</ref><ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel,Appl. Phys. Lett., 40, 178(1982).</ref><ref>J.Tersoff, and D. R. Hamann, Phys. Rev. B 31, 805 (1985).</ref><ref>J. Bardeen, Phys. Rev. Lett. 6, 57 (1961).</ref><ref>C. J. Chen, Phys. Rev. Lett. 65, 448 (1990).</ref> The STM is a powerful technique for viewing surfaces at the atomic level. The STM can be used not only in ultra high vacuum but also in air and various other liquids and gasses, and at temperature ranging from near zero Kelvin to few hundred degrees Celsius. This idea was further implemented to design the [[atomic force microscope]] (AFM)<ref>R. V. Lapshin, Nanotechnology, volume 15, 1135-1151(2004).</ref><ref>A. D L. Humphris, M. J. Miles, J. K. Hobbs, Appl. Phys. Lett. 86, 034106(2005).</ref><ref>D. Sarid, Scanning Force Microscopy, (Oxford Series in Optical and Imaging Sciences, Oxford University Press, New York, 1991).</ref><ref>V. J. Morris, A. R. Kirby, A. P. Gunning, Atomic Force Microscopy for Biologists(Imperial College Press, 1999).</ref> which is a very high-resolution type of scanning probe microscope with demonstrated resolution of fractions of a nanometer. The AFM is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. The application of RTM include the visualization and measurement of surface features having sizes dimension of nanometer in research and development laboratories as well as process control environment.
The tunneling phenomenon <ref>Razavy, Mohsen, Quantum Theory of tunneling (World Scientific, 2003).</ref> in quantum mechanics, an evanescent wave coupling effect, is used as a probe to study nano-structure on a surface with the help of [[scanning tunneling microscope]] (STM).<ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50, 120(1983).</ref><ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).</ref><ref>G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel,Appl. Phys. Lett., 40, 178(1982).</ref><ref>J.Tersoff, and D. R. Hamann, Phys. Rev. B 31, 805 (1985).</ref><ref>J. Bardeen, Phys. Rev. Lett. 6, 57 (1961).</ref><ref>C. J. Chen, Phys. Rev. Lett. 65, 448 (1990).</ref> The STM is a powerful technique for viewing surfaces at the atomic level. The STM can be used not only in ultra high vacuum but also in air and various other liquids and gasses, and at temperature ranging from near zero Kelvin to few hundred degrees Celsius. This idea was further implemented to design the [[atomic force microscope]] (AFM)<ref>R. V. Lapshin, Nanotechnology, volume 15, 1135-1151(2004).</ref><ref>A. D L. Humphris, M. J. Miles, J. K. Hobbs, Appl. Phys. Lett. 86, 034106(2005).</ref><ref>D. Sarid, Scanning Force Microscopy, (Oxford Series in Optical and Imaging Sciences, Oxford University Press, New York, 1991).</ref><ref>V. J. Morris, A. R. Kirby, A. P. Gunning, Atomic Force Microscopy for Biologists(Imperial College Press, 1999).</ref> which is a very high-resolution type of scanning probe microscope with demonstrated resolution of fractions of a nanometer. The AFM is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. The application of RTM includes the visualization and measurement of surface features having sizes and dimensions as small as a nanometer in research and development laboratories as well as process control environment.


In 2005, F. Saif used quantum recurrence phenomena as a probe to study nano-structure, and is named Recurrence Tracking Microscope (RTM).<ref>F. Saif , Phys. Rev. A 73, 033618 (2006).</ref><ref>F. Saif, Phys. Rep. 419, 207 (2005).</ref><ref>F. Saif, Phys. Rep. 425, 369 (2007).</ref><ref>F. Saif, and M. Fortunato, Phys. Rev. A 65, 013401 (2002).</ref><ref>F. Saif, J. Opt. B: Quantum Semiclass. Opt. 7, S116 (2005).</ref> The RTM consist of a) a magneto-optic trap (MOT) where super cold atom are trapped inside, b) a dielectric surface above which the evanescent wave mirror are obtained by the total internal reflection of a monochromatic laser light from the dielectric film and c) a cantilever attached to the dielectric film and its other end above the surface under investigation, as shown in the figure.
In 2005, F. Saif used quantum recurrence phenomena as a probe to study nano-structure, and is named Recurrence Tracking Microscope (RTM).<ref>F. Saif , Phys. Rev. A 73, 033618 (2006).</ref><ref>F. Saif, Phys. Rep. 419, 207 (2005).</ref><ref>F. Saif, Phys. Rep. 425, 369 (2007).</ref><ref>F. Saif, and M. Fortunato, Phys. Rev. A 65, 013401 (2002).</ref><ref>F. Saif, J. Opt. B: Quantum Semiclass. Opt. 7, S116 (2005).</ref> The RTM consist of a) a magneto-optic trap (MOT) where super cold atom are trapped inside, b) a dielectric surface above which the evanescent wave mirror are obtained by the total internal reflection of a monochromatic laser light from the dielectric film and c) a cantilever attached to the dielectric film and its other end above the surface under investigation, as shown in the figure.

Revision as of 23:47, 2 November 2013

A recurrence tracking microscope (RTM) is a microscope which is based on the quantum recurrence phenomenon of an atomic wave packet, used to investigate the nano-structure on a surface.

The tunneling phenomenon [1] in quantum mechanics, an evanescent wave coupling effect, is used as a probe to study nano-structure on a surface with the help of scanning tunneling microscope (STM).[2][3][4][5][6][7] The STM is a powerful technique for viewing surfaces at the atomic level. The STM can be used not only in ultra high vacuum but also in air and various other liquids and gasses, and at temperature ranging from near zero Kelvin to few hundred degrees Celsius. This idea was further implemented to design the atomic force microscope (AFM)[8][9][10][11] which is a very high-resolution type of scanning probe microscope with demonstrated resolution of fractions of a nanometer. The AFM is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. The application of RTM includes the visualization and measurement of surface features having sizes and dimensions as small as a nanometer in research and development laboratories as well as process control environment.

In 2005, F. Saif used quantum recurrence phenomena as a probe to study nano-structure, and is named Recurrence Tracking Microscope (RTM).[12][13][14][15][16] The RTM consist of a) a magneto-optic trap (MOT) where super cold atom are trapped inside, b) a dielectric surface above which the evanescent wave mirror are obtained by the total internal reflection of a monochromatic laser light from the dielectric film and c) a cantilever attached to the dielectric film and its other end above the surface under investigation, as shown in the figure. The RTM has advantage over existing technique of STM and AFM: (i) the material surfaces of all kinds ranging from conductors to insulators can be probed; (ii) we can study surfaces comprising of impurities without observing them, as surface structure as happened in STM; (iii) in dynamical operational mode, RTM provide information about a surface with periodic structures in the simplest manner. The experiment setup of RTM contains trapped atoms that move towards the atomic mirror under the influence of gravitational force. The mirror is made up of an evanescent wave field, which varies exponentially as a function of distance from the surface. Hence, the atoms experience a bounded motion in the presence of the optical potential and the gravitational potential together. The dynamics of an atom above the atomic mirror is controlled by the effective Hamiltonian,

where represents the center of mass momentum, is mass of the atom and is the constant gravitational acceleration. The atomic wave packet evolves classically for a short period of time and reappears after a classical period. However, after a few classical perods it spreads all over the available space following wave mechanics and collapses. But due to quantum dynamics it rebuilds itself after a certain period of time. This process is called the quantum revival of the atomic wave packet and the time at which it reappears after its collapse is called quantum revival time. The quantum revival time for the atom in TRM is calculated by finding the wave function for the Hamiltonian, given in Eq. (1).

In order to investigate a surface having arbitrary structure, the RTM is used in static mode. That is, the atom falls on the static atomic mirror without moving the surface under investigation. Its evolution over the atomic mirror requires a certain position of the cantilever, the atom displays quantum revivals at multiple revival times. As the surface under study slightly moves, the position of cantilever changes in the presence of the surface structure. Hence the initial distance between the atomic mirror and the bouncing atom over it changes. This change leads to a different initial energy for the atom and thus a different revival time. For each new revival time, the corresponding energy is calculated. This process leads to the knowledge of the structure on the surface and the surface height variations up to nanometer.

References

  1. ^ Razavy, Mohsen, Quantum Theory of tunneling (World Scientific, 2003).
  2. ^ G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50, 120(1983).
  3. ^ G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 49, 57 (1982).
  4. ^ G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel,Appl. Phys. Lett., 40, 178(1982).
  5. ^ J.Tersoff, and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
  6. ^ J. Bardeen, Phys. Rev. Lett. 6, 57 (1961).
  7. ^ C. J. Chen, Phys. Rev. Lett. 65, 448 (1990).
  8. ^ R. V. Lapshin, Nanotechnology, volume 15, 1135-1151(2004).
  9. ^ A. D L. Humphris, M. J. Miles, J. K. Hobbs, Appl. Phys. Lett. 86, 034106(2005).
  10. ^ D. Sarid, Scanning Force Microscopy, (Oxford Series in Optical and Imaging Sciences, Oxford University Press, New York, 1991).
  11. ^ V. J. Morris, A. R. Kirby, A. P. Gunning, Atomic Force Microscopy for Biologists(Imperial College Press, 1999).
  12. ^ F. Saif , Phys. Rev. A 73, 033618 (2006).
  13. ^ F. Saif, Phys. Rep. 419, 207 (2005).
  14. ^ F. Saif, Phys. Rep. 425, 369 (2007).
  15. ^ F. Saif, and M. Fortunato, Phys. Rev. A 65, 013401 (2002).
  16. ^ F. Saif, J. Opt. B: Quantum Semiclass. Opt. 7, S116 (2005).
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