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PIND

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This is an old revision of this page, as edited by 209.180.165.155 (talk) at 16:59, 17 December 2015 (Fixed citation.). The present address (URL) is a permanent link to this revision, which may differ significantly from the current revision.

A PIND test is a Particle Impact Noise Detection test.

According to method 2020.9 of MIL-STD-883, the purpose of a PIND test is to detect loose particles inside an electronics device cavity. The test provides a nondestructive means of identifying those devices containing particles of sufficient mass that, upon impact within the cavity, excite the transducer.

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[1]

  1. ^ "Test Method Standard Microelectronic Circuits MIL-STD-883J w/Change 5" (PDF). Department of Defense. Retrieved 17 December 2015.
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