分析化学

分析化学開發分析物質成分、結構的方法，使化學成分得以定性和定量，化學結構得以確定。分析化學是化學家最基礎的訓練之一，化學家在實驗技術和基礎知識上的訓練，皆得力於分析化學。當代分析化學著重儀器分析，常用的分析儀器有幾大類，包括原子與分子光譜儀，電化學分析儀器，核磁共振，X光，以及質譜儀。儀器分析之外的分析化學方法，現在統稱為古典分析化學。

分析化學型式

• 定性分析 - 以确定某一元素或化合物的存在
• 定量分析 - 以确定某一元素或化合物的数量

當代分析化學

當代分析化學將研究分為兩個範疇，一是分析的對象，一是分析的方法。<分析化學期刊>(Analytical Chemistry)每年在第12期會在兩個範疇輪流做一次回顧評述。

分析的對象

• 生物分析化學(Bioanalytical chemistry)
• 材料分析(Material analysis)
• 化學分析(Chemical analysis)
• 環境分析(Environmental analysis)
• 鑑識化學/鑑識科學(Forensic chemistry|Forensics)

分析的方法

• 光譜學
• 質譜學
• 分光度和比色法
• 層析和電泳法
• 結晶學
• 顯微術
• 電化學分析

古典分析

雖說當代分析方法絕大部分為儀器分析，但有些儀器最初的設計目的，是為了簡化古典方法的不便，基本原理仍來自於古典分析。另外，樣品配置等前置處理，仍需要藉由古典分析手法的協助。以下舉一些古典分析方法：

• 滴定法
• 重量分析
• 無機定性分析

儀器分析

• 原子吸收光譜法(Atomic absorption spectroscopy, AAS)
• 原子熒光光譜法(Atomic fluorescence spectroscopy, AFS)
• α質子-X射線光譜儀(Alpha particle X-ray spectrometer, APXS)
• 毛細管電泳分析儀(Capillary electrophoresis, CE)
• 色譜法(Chromatography)
• 比色法(Colorimetry)
• 循環伏安法(Cyclic Voltammetry, CV)
• 差示掃描量熱法(Differential scanning calorimetry, DSC)
• 電子順旋共振儀(Electron paramagnetic resonance, EPR)
• 電子自旋共振(Electron spin resonance, ESR)
• 橢圓偏振技術(Ellipsometry)
• 場流分離法(Field flow fractionation, FFF)
• 傳式轉換紅外線光譜術(Fourier Transform Infrared Spectroscopy, FTIR)
• 氣相色譜法(Gas chromatography, GC)
• 氣相色譜-質譜法(Gas chromatography-mass spectrometry, GC-MS)
• 高效液相色譜法(High Performance Liquid Chromatography, HPLC)
• 離子微探針(Ion Microprobe, IM)

• 感應耦合電漿(Inductively coupled plasma, ICP)
• Instrumental mass fractionation (IMF)
• 選擇性電極(Ion selective electrode, ISE)
• 激光誘導擊穿光譜儀(Laser Induced Breakdown Spectroscopy, LIBS)
• 質譜儀(Mass spectrometry, MS)
• 穆斯堡爾光譜儀系統(Mossbauer spectroscopy)
• 核磁共振(Nuclear magnetic resonance, NMR)
• 粒子誘發X-射線產生(Particle induced X-ray emission spectroscopy,PIXE)
• 熱裂解-氣相色譜-質譜儀(Pyrolysis-Gas Chromatography-Mass Spectrometry, PY-GC-MS)
• 拉曼光譜(Raman spectroscopy)
• 折射率
• 共振增強多光子電離譜(Resonance enhanced multi-photon ionization, REMPI)
• 掃瞄穿透X射線顯微鏡(Scanning transmission X-ray microscopy, STXM)
• 薄板層析(Thin layer chromatography, TLC)
• 穿透式電子顯微鏡(Transmission electron microscopy, TEM)
• X射線熒光光譜儀(X-ray fluorescence spectroscopy, XRF)
• X射線顯微鏡(X-ray microscopy, XRM)

See also List of materials analysis methods:

• AED - Auger electron diffraction
• AES - Auger electron spectroscopy
• AFM - Atomic force microscope
• APS - Appearance potential spectroscopy
• CAICISS - Coaxial impact collision ion scattering spectroscopy
• CL - Cathodoluminescence
• DVS - Dynamic vapour sorption
• EBSD - Electron backscatter diffraction
• EDX - Energy dispersive X-ray spectroscopy
• EID - Electron induced desorption
• EPMA- Electron Probe Microanalysis
• ESCA - Electron spectroscopy for chemical analysis; see XPS
• ESD - Electron stimulated desorption
• FEM - Field emission microscopy
• FIM-AP - field ion microscopy-Atom probe
• FTIR - Fourier transform infrared absorption spectroscopy; e.g., ATR (Attenuated Total Reflection), GI (Grazing Incidence), DRIFTS (Diffuse Reflectance)
• GDMS - Glow discharge mass spectrometry
• GDOS - Glow discharge optical spectroscopy
• GISAXS - Grazing Incidence Small Angle X-ray Scattering
• GIXD - Grazing Incidence X-ray Diffraction
• GIXR - Grazing Incidence X-ray Reflectivity
• HAS - Helium atom scattering
• HREELS - High resolution electron energy loss spectroscopy
• HRTEM – High-resolution transmission electron microscopy
• IAES - Ion induced Auger electron spectroscopy
• IGA - Intelligent gravimetric analysis
• IIX - Ion induced X-ray analysis
• INS - Ion neutralization spectroscopy
• IRS - Infra Red spectroscopy
• ISS - Ion scattering spectroscopy
• LEED - Low energy electron diffraction
• LEEM - Low-energy electron microscopy
• LEIS - Low energy ion scattering
• LIBS - Laser induced breakdown spectroscopy - also: LIPS - Laser induced plasma spectroscopy
• LOES - Laser optical emission spectroscopy
• LS - Light (Raman) scattering
• MEIS - Medium energy ion scattering

• NDP - Neutron depth profiling
• NEXAFS - Near edge X-ray absorption fine structure
• PD - Photodesorption
• PDEIS - Potentiodynamic electrochemical impedance spectroscopy
• PED - Photoelectron diffraction (also called XPD, PhD, ARPEFS)
• PIXE - Particle (or proton) induced X-ray spectroscopy
• PY-GC-MS - Pyrolysis - Gas Chromatography - Mass Spectrometry
• RBS - Rutherford backscattering spectroscopy
• REM - Reflection electron microscopy
• RHEED - Reflection high energy electron diffraction
• SAXS - Small Angle X-ray Scattering
• SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
• SE - Spetroscopic ellipsometry
• SEIRA -Surface enhanced infrared absorption spectroscopy
• SEM - Scanning electron microscopy
• SERS - Surface Enhanced Raman Spectroscopy
• SEXAFS - Surface extended X-ray absorption fine structure
• SICM - Scanning ion-conductance microscopy
• SIMS - Secondary ion mass spectrometry
• SNMS - Sputtered neutral species mass spectroscopy
• SNOM - Scanning Near-Field Optical Microscopy
• SPM - Scanning probe microscopy
• STM - Scanning tunneling microscopy
• TEM – Transmission Electron Microscopy
• TXRF - Total Reflection X-ray fluorescence analysis
• UPS - UV-photoelectron spectroscopy
• WAXS - Wide Angle X-ray Scattering
• XAES - X-ray induced Auger electron spectroscopy
• X-CTR - X-ray crystal truncation rod scattering
• XDS - X-ray diffuse scattering
• XPEEM - X-ray photoelectron emission microscopy
• XPS - X-ray photoelectron spectroscopy
• XR - X-ray reflectivity
• XRD - X-ray diffraction
• XRF - X-ray fluorescence analysis
• XSW - X-ray standing wave technique