User contributions for Fhelmli

2 March 2024

• 21:0721:07, 2 March 2024 diff hist +141 Focus variation New ISO 25178-606 and some new focus variatiion instrument show other performance in relation to measure smooth surfaces. Tags: Visual edit Mobile edit Mobile web edit

11 January 2019

• 08:4408:44, 11 January 2019 diff hist +4 Bruker →Other Tags: Mobile edit Mobile web edit
• 08:3908:39, 11 January 2019 diff hist +4 Bruker →Other: Add link Tags: Mobile edit Mobile web edit
• 08:3808:38, 11 January 2019 diff hist +203 Bruker →Other: Add buisness news. Tags: Mobile edit Mobile web edit

14 June 2018

• 21:5421:54, 14 June 2018 diff hist +4 Coordinate-measuring machine →Standardization: Fixed format Tags: Mobile edit Mobile web edit
• 21:5221:52, 14 June 2018 diff hist +856 Coordinate-measuring machine →Standardization: Add standardization Tags: Mobile edit Mobile web edit

16 October 2017

• 22:2622:26, 16 October 2017 diff hist +76 Cutting tool (machining) add image Tag: Visual edit
• 21:0821:08, 16 October 2017 diff hist +383 Cutting tool (machining) →Cutting edge: add information to k factor Tag: Visual edit
• 21:0321:03, 16 October 2017 diff hist +442 Cutting tool (machining) add the cutting edge parameters Tag: Visual edit

9 October 2015

• 05:5505:55, 9 October 2015 diff hist +126 Wikipedia:Articles for deletion/HomeMatic No edit summary

6 October 2015

• 19:3419:34, 6 October 2015 diff hist +356 Wikipedia:Articles for deletion/HomeMatic No edit summary

1 May 2015

• 15:0515:05, 1 May 2015 diff hist +4 Cutting tool (machining) →Cutting Edge
• 15:0115:01, 1 May 2015 diff hist +421 Cutting tool (machining) No edit summary

11 August 2014

• 07:3807:38, 11 August 2014 diff hist +240 Focus variation No edit summary

5 August 2014

• 12:1512:15, 5 August 2014 diff hist −24 Focus variation No edit summary

27 April 2014

• 16:2316:23, 27 April 2014 diff hist +40 Closed-loop manufacturing →Weblinks
• 16:1716:17, 27 April 2014 diff hist +110 Closed-loop manufacturing No edit summary

20 April 2014

• 21:3721:37, 20 April 2014 diff hist +117 Electrical discharge machining →Applications
• 21:3521:35, 20 April 2014 diff hist +1,529 N Closed-loop manufacturing ←Created page with 'Closed loop manufacturing (also known as CLM) is the process of manufacturing and measuring (checking) in the manufacturing machine. The pre stage to...'

29 July 2011

• 20:3820:38, 29 July 2011 diff hist +468 Micro pitting →Causes

7 October 2009

• 17:2917:29, 7 October 2009 diff hist +753 Surface metrology No edit summary

31 July 2009

• 10:5610:56, 31 July 2009 diff hist 0 Focus variation →Links
• 10:5510:55, 31 July 2009 diff hist +183 Focus variation →Links

30 July 2009

• 13:4113:41, 30 July 2009 diff hist +136 Scanning electron microscope →3D in SEM
• 13:3913:39, 30 July 2009 diff hist +274 Scanning electron microscope →Environmental SEM

27 July 2009

• 18:2418:24, 27 July 2009 diff hist +33 Profilometer →Types of profilometry
• 18:2318:23, 27 July 2009 diff hist +38 Profilometer →Types of profilometry

26 July 2009

• 18:5118:51, 26 July 2009 diff hist +95 Focus variation No edit summary
• 18:4318:43, 26 July 2009 diff hist +53 Focus variation No edit summary
• 18:2818:28, 26 July 2009 diff hist +24 ISO 25178 →References
• 18:2718:27, 26 July 2009 diff hist +15 ISO 25178 →References

24 July 2009

• 06:0006:00, 24 July 2009 diff hist +2 ISO 25178 →Focus variation
• 06:0006:00, 24 July 2009 diff hist +2 ISO 25178 →Chromatic confocal gauge
• 06:0006:00, 24 July 2009 diff hist +1 ISO 25178 →Contact profilometer
• 05:5505:55, 24 July 2009 diff hist +160 ISO 25178 No edit summary
• 05:4305:43, 24 July 2009 diff hist +88 Surface roughness No edit summary
• 05:4105:41, 24 July 2009 diff hist +10 Surface roughness →Profile roughness parameters
• 05:4005:40, 24 July 2009 diff hist +251 Surface roughness →Engineering
• 05:3705:37, 24 July 2009 diff hist +244 Surface roughness →Roughness parameters

23 July 2009

• 12:0812:08, 23 July 2009 diff hist 0 Focus variation No edit summary
• 12:0712:07, 23 July 2009 diff hist +385 Focus variation No edit summary
• 10:5010:50, 23 July 2009 diff hist +237 Surface metrology No edit summary
• 10:0110:01, 23 July 2009 diff hist +1,080 Surface metrology No edit summary
• 09:4909:49, 23 July 2009 diff hist +1 Surface metrology No edit summary
• 09:4409:44, 23 July 2009 diff hist +486 Surface metrology No edit summary
• 09:2809:28, 23 July 2009 diff hist +4 m Focus variation No edit summary

22 July 2009

• 17:1917:19, 22 July 2009 diff hist +71 Surface metrology No edit summary
• 17:1217:12, 22 July 2009 diff hist +23 Surface roughness →Measurement

21 July 2009

• 17:4717:47, 21 July 2009 diff hist +1 m Surface metrology No edit summary
• 17:4217:42, 21 July 2009 diff hist +22 Digital elevation model No edit summary